M. Markovic; M. Jufer; Y. Perriard
IEEE Transactions on Magnetics. 2005. Vol. 41, num. 12, p. 4421 – 4426. DOI : 10.1109/TMAG.2005.858408.M. Markovic; M. Jufer; Y. Perriard
IEEE Transactions on Magnetics. 2005. Vol. 41, num. 7, p. 2295 – 2299. DOI : 10.1109/TMAG.2005.850279.R. Moser; L. Sache; A. Cassat; T. Higuchi; H. Bleuler
IEEE Transactions on Industrial Applications. 2005. Vol. 41, num. 4, p. 972 – 977. DOI : 10.1109/TIA.2005.851015.S. Chevailler; M. Jufer; Y. Perriard; T. Duenser; H. Kocher
2005. p. 2099 – 2106. DOI : 10.1109/IAS.2005.1518737.M. Flückiger; M. Bullo; D. Chapuis; R. Gassert; Y. Perriard
2005. p. 2075 – 2082. DOI : 10.1109/IAS.2005.1518734.J. Persson; M. Markovic; Y. Perriard
2005. p. 238 – 244. DOI : 10.1109/IAS.2005.1518316.A. Cassat; C. Espanet; V. Bourquin; P. Hagmann; M. Jufer
2005. p. 247 – 250.M. Bullo / Y. Perriard (Dir.)
Lausanne, EPFL, 2005.J. Persson / Y. Perriard (Dir.)
Lausanne, EPFL, 2005.R. N. Hasanah / M. Jufer (Dir.)
Lausanne, EPFL, 2005.J. M. Fernandez; Y. Ruffieux; Y. Perriard
2005 IEEE Ultrasonics Symposium, Vols 1-4; 2005. p. 311 – 314.J. M. Fernandez; J. Holzbecher; M. Stutz; Y. Perriard
2005 Ieee Ultrasonics Symposium, Vols 1-4; 2005. p. 1530 – 1533.