T. Bieler; M. Perrottet; V. Nguyen; Y. Perriard
IEEE Transactions on Industry Applications. 2002. Vol. 38, num. 5, p. 1266 – 1272. DOI : 10.1109/TIA.2002.803017.Y. Perriard; C. Koechli; L. Cardoletti
2002. p. 1038 – 1043. DOI : 10.1109/IECON.2002.1185415.C. Kuert; M. Jufer; Y. Perriard
2002. p. 6 – 12. DOI : 10.1109/IAS.2002.1044060.