Thin films and surface topography

The AFM available in the MHMC platform is a Cypher VRS, located in MXG 923.

If you want to use it, please contact Philippe Charpilloz for a training.

 

Cypher VRS, Oxford Instrument

Specifications:

  • Lateral range of scanning area: ~30μm x 30μm
  • Maximum sample size: 50mm x 50mm x 20mm
  • Resolution: μm to Angstrom
  • Photo-thermal (Blue drive) excitation
  • Liquid cell
  • Heating/cooling stage

 

The ellipsometer is a SE-2000 from Semilab. It is located in MXC 905.

If you want to use it, please go on PPMS for requesting a training.

Specifications of the instrument:

  •  Microspots
  •  Detectors: Vis
  • CCD camera
  • Automated moving stage
  • Liquid Cell