Traction table
A tensile device compatible with scanning electron microscope (SEM) was developed for in-situ testing of the process of crack initiation, propagation and material deformation until fracture.
Note: available at CIME in Zeiss Gemini SEM
Cold stage / Hot stage
A conventional SEM or an environmental SEM (ESEM) can be equipped with a cold or hot stage which allows to observe wet samples or conduct in-situ studies of thermally-induced changes in materials, e.g. recrystallization in metals, melting of particles, oxidation, wetting studies…
Note: not available at CIME