This 1-credit course offered by CIME at the Doctoral School of Materials Science is taught every spring and fall semester. Students enrolled in this course learn electron scattering theory, all practical approaches for imaging and spectroscopic analysis, while also covering the underlying physics, and literature reviews along with in-class discussions on TEM sample preparation and analysis strategies specific to each enrolled student’s research project. The course also features intensive demonstrations for learning all necessary steps for standard TEM operation.
Registration
The MSE-637 course is offered twice a year, once in the fall semester (MSE-637a) and once in the spring semester (MSE-637b).
The next editions of the course will take place in the Spring Semester: 13-15 May, 2024, and in the Fall Semester: 28-30 October, 2024.
Program and lecture notes will become available on Moodle.
Please register via IS-Academia, or contact [email protected].
Objectives
1) To understand the basics of the transmission electron microscope and its imaging capabilities.
2) To understand electron diffraction.
3) To understand TEM image contrast, in particular for bright-field and dark-field imaging modes.
4) To understand the basics of image contrast in high-resolution TEM.
5) To assess TEM specimen preparation techniques for different materials (i.e. non-biological) samples.
6) To understand various application examples relevant to materials science, physics and chemistry.
Content
This intensive course is intended for researchers who are potential new users of transmission electron microscopes for study of materials (i.e. all non-biological) samples. It will provide them with a basic understanding of the instruments, sample requirements, optics of TEM, electron diffraction, the imaging modes, high-resolution TEM, and related theories of image formation.
Demonstrations will be given on the microscopes.
Basic knowledge of crystallography and diffraction is advised.