This training provides a foundation for students new to TEM. At the conclusion of this training, student will become certified user and can then independently align and operate one of the entry-level TEMs at the CIME, as well as pursue advanced training to gain access and certification for the other mid- to high-level TEMs, as well as to advanced imaging and analytical techniques (STEM, EDX, EELS, CL), depending on their research needs and objectives.
All TEM users are required to enroll and pass one of the follwing courses as a prerequisite to the training on one of the entry-level TEMs at CIME.
If you have taken a relevant course elsewhere, a quiz consisting of a series of multiple-choice questions is required to evaluate your theoretical background.
BSc course MSE-352 “Introduction to microscopy”
- Offered each Fall semester. This introductory course in microscopy aims to give an overview of the different techniques for analyzing the microstructure and composition of materials, particularly those related to electron and optical microscopy. The course includes lectures as well as demonstrations.
MSc course MSE-450 “Electron microscopy: advanced methods”
- With this course, the student will learn advanced methods in transmission electron microscopy, especially what is the electron optical setup involved in the acquisition, and how to interpret the data.
MSc course PHYS-405 “Experimental methods in physics”
This 3-credits master course is offered in Autumn semester. By the end of the course, the student must be able to integrate the notions of critical reading of articles, assess / evaluate scientific articles, their quality and defaults, and interpret knowledge of several specific experimental methods.
MSE-637 “Transmission Electron Microscopy and Diffraction Techniques”
- Offered each Spring and Fall semester. Students enrolled in this course learn electron scattering theory, all practical approaches for imaging and spectroscopic analysis, while also covering the underlying physics, and literature reviews along with in-class discussions on TEM sample preparation and analysis strategies specific to each enrolled student’s research project. The course also features intensive demonstrations for learning all necessary steps for standard TEM operation.
PHYS-637 “Electron Matter Interactions in Transmission Electron Microscopy”
- Offered every two years. This course will present the fundamentals of electron-matter interactions, as occuring in the energy range available in modern transmission electron microscopes, namely 60-300 keV electrons. Diffraction and high-resolution image formation as well as electron energy-loss spectrometry will be covered.
To pursue advanced training on the high-level TEMs (JEOL2200 FX and Titan 60-300), as well as on the advanced imaging technqiues (STEM, EDX, EELS), all users are required to enroll and pass one of the follwing advanced courses.
Prior experience on the TEM is required for advanced training.
MSE-737 “Scanning and Analytical Transmission Electron Microscopy”
- Offered every two years. This intensive course discusses advanced TEM techniques such as: scanning TEM; analytical TEM using EELS and EDX; aberration corrected imaging; and image simulation. It is intended for researchers who are potential new users of transmission electron microscopes and have followed the introductory doctoral course on TEM or have already a good background in conventional transmission electron microscopy. It will provide them with a basic understanding of the methods, relying on an explanation of the physics at play.
PHYS-637 “Electron Matter Interactions in Transmission Electron Microscopy”
- Offered every two years. This course will present the fundamentals of electron-matter interactions, as occuring in the energy range available in modern transmission electron microscopes, namely 60-300 keV electrons. Diffraction and high-resolution image formation as well as electron energy-loss spectrometry will be covered.
MSE-715 “Fundamentals of STEM lmaging and Spectroscopy”
- The course is an intensive 5-day workshop that includes lectures as well as hands-on training concerning different STEM imaging and spectroscopy techniques. The workshop will cover fundamentals of STEM, basic and advanced STEM imaging (ABF, ADF, iDPC, and 4D STEM), aberration-corrected STEM imaging and simulation, as well as acquisition and analysis of electron energy loss spectroscopy (EELS) and energy-dispersive x-ray spectroscopy (EDX) data. The students will be provided with several opportunities for hands-on training on the transmission electron microscopes, including a ThermoScientific aberration-corrected Titan-Themis. All practical sessions will be guided by electron microscopy experts of EPFL.
At the conclusion of this training, student will become certified user and can then independently operate of one of the entry-level TEMs at the CIME, as well as pursue advanced training to gain access and certification for the other mid- to high-level TEMs (JEOL2200 FX and Titan 60-300), as well as advanced imaging and analytical technqiues (STEM, EDX, EELS, CL), depending on their research needs and objectives.