NIKON SIM/STORM

Nikon SIM STORM
Nikon SIM/STORM capable superresolution microscope with full CO2 & Temperature control.

Multi-purpose super resolution microscope capable of Single Molecule Localization Microscopy (SMLM) in 3D using an astigmatic lens, as well as Structured Illumination Microcscopy (SIM) and Total Internal Reflection Fluorescence Microscopy (TIRF).

Person in charge: Romain Guiet

Book on SV-PPMS

Technical Specifications

Stand: Inverted Nikon Eclipse Ti Motorized
XY-Stage: Motorized
Illumination: HXP
Software: NIS Elements with JOBS

Detectors

CamerasPhotometrics Prime 95B
Chip Technologyback-illuminated sCMOS
Sensor Format 1200 x 1200 (effective)
Chip size13.20 mm x 13.20 mm
Pixel size11.0 um x 11.0 um
Dynamic Range16-bit
C-mountVariable 1.0x – 2.5x

Objectives

ObjectiveMag/NAMediumContrastWD (mm)
PLAN APO10x/0.45air–4.00
PLAN APO λ20x/0.75air1.00
APO TIRF100x/1.49oil–0.12

Laserlines

WavelenghtsLaser Type
405 nmOPSL, Coherent Cube 100 mW
488 nmOPSL, Coherent Saphire 480 mW
561 nmDPSS, Cobolt Jive 150 mW
641 nmOPSL, Coherent Cube 100 mW

SIM Filtercubes

NameExcitationDichroicEmissionNo
DAPI––––
GFP––––
TxRed––––
CY5––––

STORM Filtercubes

NameExcitationDichroicEmissionNo
EGFPBP 472/30F495T 495BP 520/35AHF 36-525
TxRed562/40BS 593HC 624/40AHF 36-504
CY5628/40BS 660HC 692/40AHF 36-523
N-STORM–DM 660––
Quad Band390/482/563/640405/488/561/640446/523/600/677AFH F66-401
STORM––––

On-Demand Filtercubes

NameExcitationDichroicEmissionNo
DAPIBP 377/50FT 409BP 447/60AHF 36-500
Far Red–BS 643HC 667/30AHF 48-643 + AHF 47-667
NIR–BS 643HC 732/68AHF 48-643 + AHF 39-732
50% Mirror––––

Tutorials

SIM

STORM

Calibration

SIM Check